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• Controlled Baseline
  • One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performance of –55° to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product–Change Notification
• Qualification Pedigree⁽¹⁾
• Stable with No Output Capacitor or Any Value or Type of Capacitor
• Input Voltage Range: 1.7 V to 5.5 V
• Ultralow Dropout Voltage:
  40 mV Typ at 250 mA
• Excellent Load Transient Response—with or without Optional Output Capacitor
• New NMOS Topology Provides Low Reverse Leakage Current
• Low Noise: 30 µV_RMS Typ (10 kHz to 100 kHz)
• 0.5% Initial Accuracy
• 1% Overall Accuracy (Line, Load, and Temperature)
• Less Than 1 µA Max I_Q in Shutdown Mode
• Thermal Shutdown and Specified Min/Max Current Limit Protection
• Available in Multiple Output Voltage Versions
  • Fixed Outputs of 1.2 V to 5 V
  • Adjustable Outputs from 1.2 V to 5.5 V
  • Custom Outputs Available
• APPLICATIONS
  • Portable/Battery–Powered Equipment
  • Post–Regulation for Switching Supplies
  • Noise–Sensitive Circuitry such as VCOs
  • Point of Load Regulation for DSPs, FPGAs, ASICs, and Microprocessors

⁽¹⁾Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

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