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• Controlled Baseline
  • One Assembly/Test Site, One Fabrication Site
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product-Change Notification
• Qualification Pedigree⁽¹⁾
• Available in the Texas Instruments NanoStar™ and NanoFree™ Packages
• Low Static-Power Consumption (I_CC = 0.9 µA Max)
• Low Dynamic-Power Consumption (C_pd = 4.4 pF Typ at 3.3 V)
• Low Input Capacitance (C_I = 1.5 pF)
• Low Noise — Overshoot and Undershoot <10% of V_CC
• I_off Supports Partial-Power-Down Mode Operation
• Includes Schmitt-Trigger Inputs
• Wide Operating V_CC Range of 0.8 V to 3.6 V
• Optimized for 3.3-V Operation
• 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
• t_pd = 5.1 ns Max at 3.3 V
• Suitable for Point-to-Point Applications
• Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
• ESD Performance Tested Per JESD 22
  • 2000-V Human-Body Model (A114-B, Class II)
  • 200-V Machine Model (A115-A)
  • 1000-V Charged-Device Model (C101)
• ESD Protection Exceeds 5000 V With Human-Body Model

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

NanoStar, NanoFree are trademarks of Texas Instruments.