h1_key

• Controlled Baseline
  • One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performance of –40°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product Change Notification
• Qualification Pedigree
• Buffered Inputs
• Common 3-State Output-Enable Control
• 3-State Outputs
• Bus-Line Driving Capability
• Typical Propagation Delay (Clock to Q):
     15 ns at V_CC = 5 V, C_L = 15 pF, T_A = 25°C
• Fanout (Over Temperature Range)
  • Standard Outputs . . . 10 LSTTL Loads
  • Bus Driver Outputs . . . 15 LSTTL Loads
• Balanced Propagation Delay and Transition Times
• Significant Power Reduction Compared to LSTTL Logic ICs
• V_CC Voltage = 4.5 V to 5.5 V
• Direct LSTTL Input Logic Compatibility, V_IL = 0.8 V (Max), VI_H = 2 V (Min)
• CMOS Input Compatibility, I_l ≤ 1 µA at V_OL, V_OH

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.