The ’AHCT00 device performs the Boolean function Y = (A • B) or Y = A + B in positive logic.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetalliclife, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
| Technology family | AHCT |
| Supply voltage (min) (V) | 4.5 |
| Supply voltage (max) (V) | 5.5 |
| Number of channels | 4 |
| Inputs per channel | 2 |
| IOL (max) (mA) | 8 |
| IOH (max) (mA) | -8 |
| Input type | TTL-Compatible CMOS |
| Output type | Push-Pull |
| Features | Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) |
| Data rate (max) (Mbps) | 70 |
| Rating | HiRel Enhanced Product |
| Operating temperature range (°C) | -55 to 125 |
| SOIC (D) | 14 | 51.9 mm² 8.65 x 6 |
| TSSOP (PW) | 14 | 32 mm² 5 x 6.4 |
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