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TI(德州仪器) SN74AHC00-EP
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  • TI(德州仪器) SN74AHC00-EP
  • TI(德州仪器) SN74AHC00-EP
  • TI(德州仪器) SN74AHC00-EP
  • TI(德州仪器) SN74AHC00-EP
  • TI(德州仪器) SN74AHC00-EP
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SN74AHC00-EP

SN74AHC00-EP

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增强型产品 4 通道、2 输入、2V 至 5.5V 与非门

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  • 封装 | 引脚 | 尺寸

The SN74AHC00 performs the Boolean function Y = (A • B) or Y = A + B in positive logic.

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification Qualification Pedigree
  • EPIC™ (Enhanced-Performance Implanted CMOS) Process

EPIC is a trademark of Texas Instruments.
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.

Technology familyAHC
Supply voltage (min) (V)2
Supply voltage (max) (V)5.5
Number of channels4
Inputs per channel2
IOL (max) (mA)50
IOH (max) (mA)-50
Input typeStandard CMOS
Output typePush-Pull
FeaturesOver-voltage tolerant inputs, Very high speed (tpd 5-10ns)
Data rate (max) (Mbps)110
RatingHiRel Enhanced Product
Operating temperature range (°C)-55 to 125
SOIC (D)1451.9 mm² 8.65 x 6
TSSOP (PW)1432 mm² 5 x 6.4
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