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TI(德州仪器) CD4011UB-MIL
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  • TI(德州仪器) CD4011UB-MIL
  • TI(德州仪器) CD4011UB-MIL
  • TI(德州仪器) CD4011UB-MIL
  • TI(德州仪器) CD4011UB-MIL
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CD4011UB-MIL

CD4011UB-MIL

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军用 4 通道、双输入、3V 至 18V 与非门

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CD4011UB quad 2-input NAND gate provides the system designer with direct implementation of the NAND function and supplements the existing family of CMOS gates.

The CD4011UB types are supplied in 14-lead hermetic dual-in-line ceramic packages (F3A suffix), 14-lead dual-in-line plastic packages (E suffix), 14-lead small-outline package (M, MT, M96, NSR suffixes), and 14-lead thin shrink small-outline packages (PW and PWR suffixes).

  • Propagation delay time = 30 ns (typ). at CL = 50 pF, VDD = 10 V
  • Standardized symmetrical output characteristics
  • 100% tested for quiescent current at 20V
  • Maximum input current of 1 µA at 18 V over full package temperature range; 100nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Meets all requirements of JEDEC Tentative Standard No. 13B "Standard Specifications for Description of ’B’ Series CMOS Devices"

Data sheet acquired from Harris Semiconductor

Technology familyCD4000
Supply voltage (min) (V)3
Supply voltage (max) (V)18
Number of channels4
Inputs per channel2
IOL (max) (mA)1.5
IOH (max) (mA)-1.5
Input typeStandard CMOS
Output typePush-Pull
FeaturesHigh speed (tpd 10- 50ns)
Data rate (max) (Mbps)8
RatingMilitary
Operating temperature range (°C)-55 to 125
CDIP (J)14130.4652 mm² 19.56 x 6.67
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