h1_key

• Controlled Baseline
  • One Assembly
  • Test Site
  • One Fabrication Site
• Extended Temperature Performance of -55°C to 125°C
• Enhanced Diminishing Manufacturing Sources (DMS) Support
• Enhanced Product Change Notification
• Qualification Pedigree⁽¹⁾
• Single Supply or Dual Supplies
• Wide Range of Supply Voltage
  • Max Rating . . . 2 V to 36 V
  • Tested to 30 V
• Low Supply-Current Drain Independent of Supply Voltage . . . 0.4 mA Typical Per Comparator
• Low Input Bias Current . . . 25 nA Typical
• Low Input Offset Voltage . . . 2 mV Typical
• Common-Mode Input Voltage Range Includes Ground
• Differential Input Voltage Range Equal to Maximum-Rated Supply Voltage . . . ±36 V
• Low Output Saturation Voltage
• Output Compatible With TTL, MOS, and CMOS

⁽¹⁾ Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.